发明名称 |
METHOD FOR MANUFACTURING INTERLAYER DIELECTRIC OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing an interlayer dielectric of a semiconductor device is provided to improve reliability, by intensifying a curing process after chemicals of a flowable oxide layer material for the interlayer dielectric is spin-coated. CONSTITUTION: A coating layer of a flowable oxide layer material for an interlayer dielectric is spin-coated on a semiconductor substrate. The coating layer is soft-baked to a desired temperature step to prevent the interlayer dielectric from being cracked. The soft-baked coating layer is hard-baked under a desired condition to prevent a via contact hole of the interlayer dielectric from exploding.
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申请公布号 |
KR20010018224(A) |
申请公布日期 |
2001.03.05 |
申请号 |
KR19990034087 |
申请日期 |
1999.08.18 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUN, TAE HA |
分类号 |
H01L21/31;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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