发明名称 METHOD FOR MANUFACTURING INTERLAYER DIELECTRIC OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing an interlayer dielectric of a semiconductor device is provided to improve reliability, by intensifying a curing process after chemicals of a flowable oxide layer material for the interlayer dielectric is spin-coated. CONSTITUTION: A coating layer of a flowable oxide layer material for an interlayer dielectric is spin-coated on a semiconductor substrate. The coating layer is soft-baked to a desired temperature step to prevent the interlayer dielectric from being cracked. The soft-baked coating layer is hard-baked under a desired condition to prevent a via contact hole of the interlayer dielectric from exploding.
申请公布号 KR20010018224(A) 申请公布日期 2001.03.05
申请号 KR19990034087 申请日期 1999.08.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUN, TAE HA
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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