| 摘要 |
PURPOSE: An equipment is provided to realize a high accurate test while shortening the test time significantly using a conventional inexpensive tester without requiring any expensive semiconductor tester and to eliminate the need of a reference voltage generator for each type of semiconductor integrated circuit to be tested. CONSTITUTION: The equipment for inspecting a liquid crystal driver LSI(1) comprises a reference voltage generator(8) for generating a plurality of expected value voltages being compared with the output voltage from each output terminal(3) and outputting a set of a plurality of kinds of reference voltage required for inspecting a plurality of types of semiconductor integrated circuits, a plurality of differential amplifiers(5) each having one input terminal(6) receiving the output voltage from each output terminal(3) and the other input terminal(7) receiving an expected value voltage from the voltage generator(8), and a comparator(12) receiving an amplified output voltage from the differential amplifier(5) and making a decision whether it falls within a specified voltage range.
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