发明名称 METHOD FOR SHAPING COMPOUND SEMICONDUCTOR WAFER EDGE
摘要 <p>PROBLEM TO BE SOLVED: To provide a polishing composite that is superior in stability and durability of polishing power and does not harm working environment in a method for mirror polishing the edge of a compound semiconductor wafer. SOLUTION: The edge of a compound semiconductor wafer is mirror-polished by pressing the edge part of a compound semiconductor wafer to a drum of a polishing machine, having a drum with a polishing pad adhered on its surface, and rotating both the compound semiconductor wafer and the drum, while supplying a polishing composite. In this case, the polishing composite contains a peroxide compound or a peroxoacid compound, a water-soluble amine, and colloidal silicon-oxide particles, and yields a pH value in the range of 7.0-0.5.</p>
申请公布号 JP2001044148(A) 申请公布日期 2001.02.16
申请号 JP19990212477 申请日期 1999.07.27
申请人 SPEEDFAM CO LTD 发明人 TANAKA HIROAKI;TANIWAKI TSUKASA;INOUE HIROAKI
分类号 B24B9/00;B24B37/00;C09K3/14;H01L21/304;(IPC1-7):H01L21/304 主分类号 B24B9/00
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