| 摘要 |
An integrated circuit, a programming mechanism and a method is provided for programming test information upon non-volatile storage devices of the integrated circuit. The test information includes a pass/fail outcome arising from one or more test operations to which the integrated circuit is exposed. In addition to or in lieu of the test outcomes, test results of one or more parametric tests at select test operations can be measured from and programmed back into the integrated circuit. Test limits against which the test results can be compared may also be programmed into the integrated circuit. The test outcomes of various test operations, test results of various test parameters and test limits of the same or dissimilar test parameters are stored in separate non-volatile storage locations attributed to the integrated circuit. Those storage locations and, particularly, the bits contained therein are read either before the integrated circuit is packaged, after it is packaged, or after the packaged integrated circuit is shipped to customer. Programming test information as to that particular integrated circuit provides traceability of test operations performed, quality control of integrated circuits shipped, failure analysis of integrated circuits manufactured and, in some instances, lessened overall test time.
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