发明名称 LOW TEMPERATURE OXIDATION OF CONDUCTIVE LAYERS FOR SEMICONDUCTOR FABRICATION
摘要 <p>A method for forming a valve metal oxide for semiconductor fabrication in accordance with the present invention is disclosed and claimed. The method includes the steps of providing a semiconductor wafer (100), depositing a valve metal (110) on the wafer, placing the wafer in an electrochemical cell (200) such that a solution (114) including electrolytes interacts with the valve metal to form a metal oxide (111) when a potential difference is provided between the valve metal (110) and the solution (114) and processing the wafer using the metal oxide layer.</p>
申请公布号 WO2000075978(A1) 申请公布日期 2000.12.14
申请号 US2000014343 申请日期 2000.05.25
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