发明名称 Borderless vias with CVD barrier layer
摘要 Borderless vias are filled by initially depositing a thin, conformal layer of titanium nitride by chemical vapor deposition to cover an undercut, etched side surface of a lower metal feature. A metal, such as tungsten, is subsequently deposited to fill the borderless via. Embodiments include thermal decomposition of an organic-titanium compound, such as tetrakis-dimethylamino titanium, and treating the deposited titanium nitride in an H2/N2 plasma to lower its resistivity.
申请公布号 US6159851(A) 申请公布日期 2000.12.12
申请号 US19990295362 申请日期 1999.04.21
申请人 ADVANCED MICRO DEVICES, INC. 发明人 CHEN, ROBERT C.;GREENLAW, DAVID C.;IACOPONI, JOHN A.
分类号 H01L21/285;H01L21/28;H01L21/768;H01L23/522;(IPC1-7):H01L21/44 主分类号 H01L21/285
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