发明名称 ELECTROSTATIC CHUCK FOR HEATING AND HOLDING WAFER
摘要 <p>PROBLEM TO BE SOLVED: To provide a light-weight and compact electrostatic chuck for heating and holding a wafer flat, which provides a high (electrostatic) chucking force for holding an electrostatic wafer flat, facilitates it control, can adequately attain heating of the wafer without nonuniformity of temp. and is superior in wafer-chucking performance and heat controllability. SOLUTION: A wafer plate comprises a dipole-type electrostatic chuck for holding a wafer flat and a heater for heating the wafer, using an a.c. power source, and the electrostatic chuck has dipole electrodes 3, 4, one or both of which serve also as a heating element for the heater.</p>
申请公布号 JP2000332089(A) 申请公布日期 2000.11.30
申请号 JP19990136558 申请日期 1999.05.18
申请人 TOSHIBA CERAMICS CO LTD 发明人 MATSUMURA SHIGEKO;AONUMA SHINICHIRO;SANO KOJI;FUJITA MITSUHIRO
分类号 H01L21/302;H01L21/205;H01L21/3065;H01L21/68;H01L21/683;(IPC1-7):H01L21/68;H01L21/306 主分类号 H01L21/302
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