| 摘要 |
PROBLEM TO BE SOLVED: To shorten test time and reduce cost required for a burn-in test by removing a factor causing a failure when a failure rate increases during the burn-in test to continue the test continuously. SOLUTION: This semiconductor testing device is provided with a memory 34 storing failure rate specified value information 38 specifying an upper limit of a failure rate of a test for every kind of test in advance and a CPU 32 which measures a failure rate of a semiconductor integrated circuit for every kind of test, compares the measured failure rate with the failure rate specified value information, and judges whether the test is interrupted or not.
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