发明名称 |
Printed circuit board testing apparatus and probe device for use in the same |
摘要 |
<p>A probe device is mounted on a circuit provided with a holder mountable to a circuit board testing apparatus, a contact needle attachable to the holder. The contact needle is operable to resiliently bend in a specified direction immediately after coming into contact with a circuit board. The bending absorbs a contact impact to ensure accurate measurement. <IMAGE></p> |
申请公布号 |
EP1055930(A2) |
申请公布日期 |
2000.11.29 |
申请号 |
EP20000110969 |
申请日期 |
2000.05.26 |
申请人 |
NIHON DENSAN READ KABUSHIKI KAISHA |
发明人 |
NISHIKAWA, HIDEO |
分类号 |
G01R1/067;(IPC1-7):G01R1/067 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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