Magnetic field characterization process, especially for magnetic read/write heads, comprises providing a magnetosensitive layer between a component surface and a scanning force microscope sensor

摘要

A magnetic field characterization process, comprising provision of a magnetosensitive layer between a component surface and a scanning force microscope sensor, is new. Independent claims are also included for the following: (i) apparatus for carrying out the above process; (ii) a scanning force microscope sensor bearing a magnetosensitive layer; and (iii) use of a scanning force microscope sensor for characterizing a magnetic field from a magnetic read/write head with micrometer dimensions.