| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor element-connecting apparatus which can accurately connect even fine and high-density semiconductor element electrodes to an electric inspection apparatus (jig) or the like, thus permitting efficient inspection for semiconductor elements, and which is free from the abnormal deformation of the conductive part of an anisotropic conductive sheet even when repeatedly used, has a superior durability and can be stably used for a long time. SOLUTION: The electric connecting apparatus for semiconductor elements with projecting electrodes has a connecting part 3 to which the projecting electrodes are electrically connected, and an anisotropic conductive elastic body with conductive parts 4a set to an area connected to the connecting part 3 and separated from a position corresponding to the projecting electrodes.
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