发明名称 INSPECTION SYSTEM FOR IIC BUS CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide an inspection system for an IIC bus circuit, by which the voltage control characteristic of a slave circuit can be inspected in an extremely short time. SOLUTION: In an inspection apparatus 21, two each of data for inspection, which are outputted to a slave circuit 2 are increased sequentially from '01H'. When the data reach an upper-limit value of 'FFH', the data are outputted in such a way that two each are decreased sequentially from 'FFH'. After the transmission of the data for inspection is completed by a bus interface part 22 for inspection, the level of a clock signal is maintained at a low level so as to be stopped. The ratio of its stop time is changed. The output waveform of a low-pass filter 24 is made to be nearly sinusoidal. Then, the inspection apparatus 21 measures the amplitude distorsion of the output waveform. Whether a D/A conversion level according to control data is obtained in the slave circuit 2 or not is inspected.
申请公布号 JP2000266821(A) 申请公布日期 2000.09.29
申请号 JP19990070172 申请日期 1999.03.16
申请人 TOSHIBA MICROELECTRONICS CORP;TOSHIBA CORP 发明人 NAKAJIMA TATSUO
分类号 G06F11/22;G01R31/316 主分类号 G06F11/22
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