发明名称 Adaptive PCB testing system employing rearrangable test probes
摘要 A printed circuit board (PCB) testing system for testing various types of PCBs includes a base plate corresponding to a target PCB; a plurality of probe assemblies, each having a probe pin electrically contactable with the target PCB and a removably securing member for removably attaching the probe pin on the base plate; a test point selection unit for determining a plurality of test points located on a target PCB to generate a test point selection signal representing the determined test points; and a probe arranging unit, in response to the test point selection signal, for moving and arranging said probes on positions of the base plate corresponding to said each determined test point to thereby bring each probe pin into contact with a corresponding test point.
申请公布号 US6118288(A) 申请公布日期 2000.09.12
申请号 US19980014287 申请日期 1998.01.27
申请人 KANG, JEUNG GUN 发明人 KANG, JEUNG GUN
分类号 G01R31/02;G01R1/073;G01R31/28;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R31/02
代理机构 代理人
主权项
地址