发明名称 A DETECTION CIRCUIT FOR FAILED DC VOLTAGE BY THE OUTPUT VOLTAGE LEVEL ON THE PAD
摘要 PURPOSE: A circuit for detecting a defect of a direct voltage according to an output voltage level of a pad is provided to test the reliability of a direct voltage generator by finding the direct voltage generator with a defect. CONSTITUTION: A circuit for detecting a defect of a direct voltage according to an output voltage level of a pad comprises a reference voltage generation block(10), a voltage level detection block(20), a decoder block(30), and a variable output voltage generation block(40). The reference voltage generation block(10) generates a reference voltage. The voltage level detection block(20) detects a comparative level for detecting a defect of a direct voltage by using the reference voltage. The decoder block(30) determines a valid level of the detected voltage. The variable output voltage generation block(40) generates a variable output voltage.
申请公布号 KR100265045(B1) 申请公布日期 2000.09.01
申请号 KR19970077391 申请日期 1997.12.29
申请人 HYUNDAI ELECTRONICS IND. CO., LTD 发明人 NAM, YOUNG-JUN
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
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