发明名称 |
A DETECTION CIRCUIT FOR FAILED DC VOLTAGE BY THE OUTPUT VOLTAGE LEVEL ON THE PAD |
摘要 |
PURPOSE: A circuit for detecting a defect of a direct voltage according to an output voltage level of a pad is provided to test the reliability of a direct voltage generator by finding the direct voltage generator with a defect. CONSTITUTION: A circuit for detecting a defect of a direct voltage according to an output voltage level of a pad comprises a reference voltage generation block(10), a voltage level detection block(20), a decoder block(30), and a variable output voltage generation block(40). The reference voltage generation block(10) generates a reference voltage. The voltage level detection block(20) detects a comparative level for detecting a defect of a direct voltage by using the reference voltage. The decoder block(30) determines a valid level of the detected voltage. The variable output voltage generation block(40) generates a variable output voltage.
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申请公布号 |
KR100265045(B1) |
申请公布日期 |
2000.09.01 |
申请号 |
KR19970077391 |
申请日期 |
1997.12.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
NAM, YOUNG-JUN |
分类号 |
H01L21/66;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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