发明名称 Contact location detecting mechanism of touch signal probe for detecting contact with workpiece using rotary motion generator for scanning stylus with phase detector providing highly accurate measurement
摘要 The configuration of a work piece is measured using a combination of a probe contact detection system and a position detector. The position detector uses measurement of phase value of a signal derived from scanning the detector probe with a rotary motion generator. A rotary motion generator (30) scans a stylus (102). A phase rotation detector (50) detects a phase value indicating a rotation position. A contact location detector (70) detects a contact location. The stylus is vibrated by a vibrator (103A) in the stylus holder. A detector (103B) detects changes in the vibrations due to surface contacts and outputs a voltage signal to the contact detector.
申请公布号 DE10000250(A1) 申请公布日期 2000.08.31
申请号 DE20001000250 申请日期 2000.01.05
申请人 MITUTOYO CORP., KAWASAKI 发明人 MATSUKI, KAORU;OKAMOTO, KIYOKAZU;HIDAKA, KAZUHIKO
分类号 G01B7/00;G01B7/012;G01B21/00;G01B21/04;G01B21/20;G12B21/12;(IPC1-7):G12B21/12 主分类号 G01B7/00
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