发明名称 |
Contact location detecting mechanism of touch signal probe for detecting contact with workpiece using rotary motion generator for scanning stylus with phase detector providing highly accurate measurement |
摘要 |
The configuration of a work piece is measured using a combination of a probe contact detection system and a position detector. The position detector uses measurement of phase value of a signal derived from scanning the detector probe with a rotary motion generator. A rotary motion generator (30) scans a stylus (102). A phase rotation detector (50) detects a phase value indicating a rotation position. A contact location detector (70) detects a contact location. The stylus is vibrated by a vibrator (103A) in the stylus holder. A detector (103B) detects changes in the vibrations due to surface contacts and outputs a voltage signal to the contact detector.
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申请公布号 |
DE10000250(A1) |
申请公布日期 |
2000.08.31 |
申请号 |
DE20001000250 |
申请日期 |
2000.01.05 |
申请人 |
MITUTOYO CORP., KAWASAKI |
发明人 |
MATSUKI, KAORU;OKAMOTO, KIYOKAZU;HIDAKA, KAZUHIKO |
分类号 |
G01B7/00;G01B7/012;G01B21/00;G01B21/04;G01B21/20;G12B21/12;(IPC1-7):G12B21/12 |
主分类号 |
G01B7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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