发明名称 Integrated circuit testing
摘要 A system for the debugging of integrated circuit designs containing a plurality of macrocells A, B and C utilises multiplexers 68, 70 and 72 associated with external output connections to select either a normal external output signal or a diagnostic internal signal. In operation, a primary integrated circuit and a tracking integrated circuit are supplied with identical input signals and so adopt identical states. The primary integrated circuit selects the normal external output signals whilst the tracking integrated circuit selects for diagnostic purposes predetermined internal signals. A further tracking integrated circuit 74 may be provided that corresponds to one of the macrocells A within the primary integrated circuit and the tracking integrated circuit to provide further details of the operation of this macrocell.
申请公布号 GB2312048(B) 申请公布日期 2000.08.09
申请号 GB19960007684 申请日期 1996.04.12
申请人 * ADVANCED RISC MACHINES LIMITED;* ARM LIMITED;* ARM LIMITED 发明人 BRUCE * MATHEWSON
分类号 G01R31/28;G06F11/22;G06F11/273;(IPC1-7):G01R31/26;H01L21/66 主分类号 G01R31/28
代理机构 代理人
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