| 摘要 |
A dual-pin probe (100) has a probe body (104), a probe head (102), a signal pin (120), and a ground pin (122). The probe body couples to a robotic system configured to manipulate the dual-pin probe relative to a circuit board under test. The probe body is coupled to the probe head. The signal pin and the ground pin extend from a face of the probe head and are substantially parallel to one another. The ground pin is at a variable distance from the signal pin. The robotic system varies the distance between the ground pin and the signal pin, and positions the ground pin and the signal pin to contact nodes on the circuit board to automate the test. |
