发明名称 PROBE CARD AND METHOD FOR TESTING ELECTRIC CHARACTERISTIC OF BODY TO BE TESTED
摘要 PROBLEM TO BE SOLVED: To make the electric characteristics of a body to be tested testable with high accuracy without causing any defective conditions such as the adhesion of the material of the electrode pad of a body to be tested to the tip of a probe needle, the oxidation of the tip side of the probe needle. SOLUTION: The probe card 1 is provided with a substrate 2 and a probe needle 3 in a state supported by the substrate 2 extended downward from the probe card 1, and the tip of the probe needle 3 is brought into contact with an electrode pad of a body to be inspected to test the electric characteristics of the body to be tested. The probe card 1 is provided with a supply part 4 for supplying the probe needle 3 with a coating liquid so as to coat the surface of the tip side of the probe needle 3 at all times. The coating liquid is formed of a liquid which is non-conductive, is nonvolatile in test atmosphere, and does not corrode the body to be tested. At the time of test, by bringing the tip of the probe needle 3 into contact with the electrode pad of the body to be tested as coating the surface of the tip side of the probe needle 3 with the coating liquid, the electric characteristics of the body to be tested are tested.
申请公布号 JP2000206149(A) 申请公布日期 2000.07.28
申请号 JP19990007215 申请日期 1999.01.14
申请人 SONY CORP 发明人 SAKAMOTO TSUTOMU
分类号 G01R31/26;G01R1/073;H01L21/66;(IPC1-7):G01R1/073 主分类号 G01R31/26
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