发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to improve a reliability of a device by removing the remaining polycrystal silicon. CONSTITUTION: A method for manufacturing a semiconductor device comprises the following steps. A cell region and a peripheral region are defined on a substrate(31). An insulating layer is applied on the substrate. A multitude of word line(33) formed with a gap insulating layer is formed. A first insulating layer side wall(34a) is formed on both substrate of each word line of the cell region. A first insulating layer(34) is formed including on the substrate of the peripheral region including the word lines. A conductive material is formed on a front face of the substrate. A plug is formed on the cell region by flattening the conductive material. The remaining conductive material of the peripheral region is removed by mixed plasma of SF6+O2.
申请公布号 KR20000043976(A) 申请公布日期 2000.07.15
申请号 KR19980060415 申请日期 1998.12.29
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 LIM, MYUNG HO
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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