发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to improve a reliability of a device by removing the remaining polycrystal silicon. CONSTITUTION: A method for manufacturing a semiconductor device comprises the following steps. A cell region and a peripheral region are defined on a substrate(31). An insulating layer is applied on the substrate. A multitude of word line(33) formed with a gap insulating layer is formed. A first insulating layer side wall(34a) is formed on both substrate of each word line of the cell region. A first insulating layer(34) is formed including on the substrate of the peripheral region including the word lines. A conductive material is formed on a front face of the substrate. A plug is formed on the cell region by flattening the conductive material. The remaining conductive material of the peripheral region is removed by mixed plasma of SF6+O2.
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申请公布号 |
KR20000043976(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980060415 |
申请日期 |
1998.12.29 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
LIM, MYUNG HO |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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