发明名称 BACK ANNOTATION METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To decrease pseudo timing violation at the time of timing verification by reducing the error between the circuit simulation result and cell delay information for logic simulation. SOLUTION: Based on the error between the circuit simulation result 1012 and cell delay information 1013 of gate level calculated by the approximate function thereof, delay error correction information 1015 depending on the input signal waveform rounding and output load capacity of a cell is calculated. While referring to the said delay error correction information 1015 from the input signal waveform rounding and output load capacity found at the time of delay value calculation for back annotation using layout information 1014, a delay value for back annotation is corrected.
申请公布号 JP2000194734(A) 申请公布日期 2000.07.14
申请号 JP19980370802 申请日期 1998.12.25
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 IIDA HIROICHI;TAGUCHI HIROFUMI
分类号 H01L21/82;G01R31/28;G06F17/50;(IPC1-7):G06F17/50 主分类号 H01L21/82
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