发明名称 SEMICONDUCTOR MEMORY HAVING SUB-WORD LINE DRIVING CIRCUIT
摘要 PURPOSE: A semiconductor memory having a sub-word line driving circuit is provided to simplify a layout and to reduce the size of a memory chip by decreasing the number of additional NMOS(n-channel metal oxide semiconductor) transistors for connecting a sub-word line to a grounding. CONSTITUTION: A first sub-word line driving unit(200) has four sub-word line driving units(SWLD101-SWLD104) and first to third NMOS transistors. The first to fourth sub-word line driving units selectively output first and second lower pre-decoding signals(P0,P1) or grounding potentials to each sub-word line(SWL0,SW2,SW5,SW7) through inverted first and second global word line enable signals(GWLB0,GWLB1). Each first and second lower pre-decoding signal(PB0,PB1) inverted to a gate is fed and the same lower pre-decoding signals are transmitted to adjacent sub-word lines. The first to third NMOS transistors connect the adjacent sub-word lines.
申请公布号 KR20000038795(A) 申请公布日期 2000.07.05
申请号 KR19980053909 申请日期 1998.12.09
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 JEONG, JAE HONG
分类号 G11C11/407;G11C8/08;G11C8/14;(IPC1-7):G11C11/407 主分类号 G11C11/407
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