| 摘要 |
PROBLEM TO BE SOLVED: To test an analog circuit by a method wherein the internal connection of a semiconductor integrated circuit is changed over by an external signal, a signal for the test can be input to, and output from, the analog circuit from the outside and the signal the for test can be input to, and output from, a proper input/output terminal. SOLUTION: When an analog circuit A 102 is tested, a signal for the test is input to an analog exclusive-use terminal 112 so as to be processed by the analog circuit A 102. A control signal to be used to test the analog circuit A 102 is sent to a control circuit 106 from a digital exclusive-use terminal 114. Signals inside a connecting line 117 for a control signal A, a connecting line 118 for a control signal B and a connecting line 120 for a control signal D are set at an H-level, and a signal inside a connecting line 119 for a control signal C is set at an L-level. As a result, the signal for the test from the analog circuit A 102 does not flow to an analog circuit B 103, and A/D conversion circuit 104 and a digital circuit 105 so as to be output to the outside via a terminal 115 for analog input/output and digital output. Consequently, the analog circuit A 102 can be tested by this route.
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