发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To suppress the starting of a parasitic thyristor and improve the latch up breakdown voltage by cutting off trigger currents flowing in a first conductivity type well region and a semiconductor substrate, based on the potential difference between a first and second power sources in the event of a potential variation. SOLUTION: N-channel MOSFETs Qn1 in output buffer circuit cells 20B of a buffer circuit are constituted on a main surface of an SITAP type well region 4 formed on a p- type semiconductor substrate 1. Between the p-type well region 4 and the p-type semiconductor substrate 1, an isolation region 2 for electrically isolating both mutually is constituted. When a noise occurs in a reference power source Vss1 by the operation of the output buffer circuit composed of output buffer circuit cells 20B, trigger currents flowing in the p-type well region 4 and the p- type semiconductor substrate 1 can be cut off through the isolation region 2, based on the potential difference between the reference power sources Vss1, Vss2.
申请公布号 JP2000174140(A) 申请公布日期 2000.06.23
申请号 JP20000008313 申请日期 2000.01.17
申请人 HITACHI LTD 发明人 TAKAHASHI TOSHIRO;KOIDE KAZUO
分类号 H01L21/8238;H01L21/82;H01L27/092;H01L27/118;(IPC1-7):H01L21/823 主分类号 H01L21/8238
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