| 摘要 |
PROBLEM TO BE SOLVED: To obtain a semiconductor integrated circuit device that incorporates an inspection facilitating circuit that attains measurement with high precision by using an inexpensive inspection device without increasing an inspection time. SOLUTION: The semiconductor integrated circuit device incorporates a D/A converter including a plurality of reference power supply terminals 110,... a resistance division circuit 12 that applies resistance division to a voltage among the reference power supply terminals 110,... to generate an intermediate voltage, and a gradation voltage selector switch 5 that selects any of the reference power supply voltages and intermediate voltages in response to an input digital signal and outputs an output voltage of the D/A converter from its output terminal 6. Relays 13, 14 are provided to locally short-circuit part of the resistance division circuit 12. Through the configuration above, the voltage between the output voltage being an inspection object can be extended, and digital discrimination by a comparator is attained in place of the measurement by a conventional analog voltage measurement device with high precision, the inspection time can considerably be reduced and high precision inspection is attained by using the inexpensive digital inspection device.
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