发明名称 Method of manufacturing a semiconductor device
摘要 The semiconductor of this invention is provided with a first inter-layer insulating film formed on the surface of a semiconductor substrate to a first film thickness; a plurality of first wiring patterns formed on the surface of the first inter-layer insulating film; a dummy pattern formed between the first wiring patterns and insulated electrically from the wiring patterns; a second inter-layer insulating film formed from the first inter-layer insulating film to a second film thickness so as to cover the surfaces of the first inter-layer insulating film, the first wiring patterns, the dummy pattern; and second wiring patterns formed on the surface of the second inter-layer insulating film and wherein the dummy pattern has no planar overlapped portion with respect to the second wiring patterns, that is, it is separated from the second wiring patterns in top view.
申请公布号 US6069067(A) 申请公布日期 2000.05.30
申请号 US19990299149 申请日期 1999.04.26
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KINUGAWA, MASAAKI
分类号 H01L23/528;(IPC1-7):H01L21/476 主分类号 H01L23/528
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