发明名称 APPARATUS AND METHOD FOR INSPECTING DIGITAL-ANALOG HYBRID IC
摘要 PROBLEM TO BE SOLVED: To reduce cost and the time taken for tests. SOLUTION: This apparatus for inspecting a digital-analog hybrid IC providing digital signal outputs and analog signal outputs comprises a means 24 for comparing a signal inputted to an input terminal with a reference value and a means 25 for determining the quality of the signal, based on the compared result by the comparing means. A digital signal from the digital-analog hybrid IC 1 is inputted directly to the input terminal of the comparing means and an analog signal from the digital-analog hybrid IC 1 is inputted to the input terminal of the comparing means through a correlation double sampling means 2.
申请公布号 JP2000147072(A) 申请公布日期 2000.05.26
申请号 JP19980313421 申请日期 1998.11.04
申请人 CANON INC 发明人 TAKIZAWA SATORU
分类号 G01R31/316;G01R31/28;(IPC1-7):G01R31/316 主分类号 G01R31/316
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