发明名称 High voltage semiconductor structure
摘要 A high voltage MOSFET with low on-resistance and a method of lowering the on-resistance for a specific device breakdown voltage of a high voltage MOSFET. The MOSFET includes a blocking layer of a first conductivity type having vertical sections of a second conductivity type or the blocking layer may include alternating vertical sections of a first and second conductivity type.
申请公布号 US6066878(A) 申请公布日期 2000.05.23
申请号 US19980108962 申请日期 1998.07.02
申请人 INTERSIL CORPORATION 发明人 NEILSON, JOHN M. S.
分类号 H01L29/06;H01L29/10;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/06
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