发明名称 Single layer integrated metal enhancement mode field-effect transistor apparatus
摘要 An enhancement mode periodic table group III-IV semiconductor field-effect transistor device is disclosed. The disclosed transistor includes single metallization for ohmic and Schottky barrier contacts, a permanent non photosensitive passivation layer (a layer which has also been used for masking purposes during fabrication of the transistor) and a gate element of small dimension and shaped cross section as needed to provide desirable microwave spectrum electrical characteristics. The transistor of the invention is fabricated from undoped semiconductor materials disposed in a layered wafer structure and selectively doped by ion implantation to achieve either a p-channel or an n-channel transistor. The semiconductor materials may include two, one or zero buffer layers in their layer structure. The disclosed transistor is of reduced fabrication cost, increased dimensional accuracy and state of the art electrical performance.
申请公布号 US6066865(A) 申请公布日期 2000.05.23
申请号 US19980059891 申请日期 1998.04.14
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE AIR FORCE 发明人 CERNY, CHARLES L. A.;BOZADA, CHRISTOPHER A.;DESALVO, GREGORY C.;EBEL, JOHN L.;DETTMER, ROSS W.;GILLESPIE, JAMES K.;HAVASY, CHARLES K.;JENKINS, THOMAS J.;NAKANO, KENICHI;PETTIFORD, CARL I.;QUACH, TONY K.;SEWELL, JAMES S.;VIA, G. DAVID
分类号 H01L21/285;H01L21/335;H01L29/812;(IPC1-7):H01L31/032 主分类号 H01L21/285
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