发明名称 |
PRODUCTION OF SYNTHETIC QUARTZ GLASS FOR ArF EXCIMER LASER LITHOGRAPHY |
摘要 |
<p>PROBLEM TO BE SOLVED: To obtain an optical material excellent in homogeneity and having a high transmittance by irradiating a homogenized synthetic quartz glass with the Na content specified with the UV of specified wavelength under controlled conditions. SOLUTION: A synthetic quartz glass contg. 24-60 ppb Na is homogenized. The synthetic quartz glass is irradiated with the UV of <=260 nm wavelength for a time expressed by Y=(80X-1880)/z. In the expression, X is the Na concentration (ppb), Y is the irradiating time (hour), and Z is the illuminance (mW/cm2) of the UV on the irradiated face. A low-pressure mercury lamp of 253.7 and 184.9 nm dominant wavelength, an Xe excimer lamp of 172 nm wavelength or a KrCl excimer lamp of 222 nm wavelength is exemplified as the lamp to be used in UV irradiation. The surface roughness Rmax of the synthetic quartz glass to be irradiated with UV is preferably controlled to <=30μm.</p> |
申请公布号 |
JP2000143258(A) |
申请公布日期 |
2000.05.23 |
申请号 |
JP19990011907 |
申请日期 |
1999.01.20 |
申请人 |
SHINETSU QUARTZ PROD CO LTD |
发明人 |
OSHIMA TAKAYUKI;FUJINOKI AKIRA;NISHIMURA HIROYUKI;YAGINUMA YASUYUKI |
分类号 |
H01L21/027;C03B20/00;C03C3/06;C03C23/00;G03F1/60;(IPC1-7):C03B20/00;G03F1/14 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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