APPARATUS FOR MEASURING TRANSVERSAL PROFILE OF CHARACTERISTICS OF MATERIAL PASSAGE

摘要

PROBLEM TO BE SOLVED: To shorten the total control time to make able to ensure accurate control by irradiating a material passage with light from a beam source in a plurality of wavelength ranges and detecting only one of them at a specified time. SOLUTION: The transversal profile measuring apparatus 14 having a beam source 18 and a sensor 20 is provided for a measuring point. A material passage 12 extends below the profile measuring apparatus 14 in a fixed direction L. A light beam source 18 and a sensor 20 are opposed for each measuring point at observing windows 16 and 16' disposed with spacings from the material passage 12 in a casing 22 of the profile measuring apparatus 14. The sensor 20 is at a distance of about 5-20 mm from the material passage 12. In the casing 22 an evaluating electronic circuit 24 is disposed and connected to an upper power supply, etc. The material passage is irradiated at a plurality of wavelength ranges, using the beam source 18. The sensor 20 detects only a light reflected from the material passage 12 at a specified time.