| 摘要 |
<p>Potentially defective pixel regions (100) of a discrete pixel detector are identified through analysis of a series of dark images and a series of exposed images. In the case of an x-ray system, the dark images are created with little or no radiation impacting the detector, while the exposed images are created with a uniform level of radiation over the detector surface. Output signals from the detector are averaged over the series of dark images, and over the series of exposed images. Analyses are performed on the average values to identify pixels producing inconsistent output signals, pixels producing output signals varying more than a desired amount from reference levels, and pixels producing output signals varying more than a desired amount from output signals of neighboring pixels (102, 104, 106, 108). A mask is generated referencing the defective pixels (100) for use in processing subsequent images. <IMAGE></p> |
