SEMICONDUCTOR MEMORY

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor memory in which generating an operation mode signal for a test dedicated is prevented at the time of use by a user. SOLUTION: This device is a semiconductor memory which has a test mode decoder 12 decoding plural input signals setting an operation mode for a test dedicated and generating a signal specifying an operation mode for a specific test dedicated and which can set operation modes for various tests, further the device has a pad 13 for testing a probe making the test mode decoder effective at the time of applying voltage.