发明名称 |
SEMICONDUCTOR DEVICE, SEMICONDUCTOR LIGHT EMITTING DEVICE AND MANUFACTURE THEREOF, AND FORMING METHOD OF NITRIDE SEMICONDUCTOR LAYER |
摘要 |
PROBLEM TO BE SOLVED: To provide a nitride semiconductor light emitting device which is capable of operating on a low voltage and possessed of edge faces that can be formed by cleavage, and a manufacturing method thereof. SOLUTION: A GaN layer is formed on a sapphire substrate, an SiO2 film is formed on the GaN layer, and then a GaN semiconductor layer 18 that includes an MQW light emitting layer 8 is grown on the GaN layer and the SiO2 layer through a lateral growth technique. The GaN semiconductor layer is removed from the sapphire substrate except from a region on the SiO2 film, then a P electrode 13 is formed on the top surface of the GaN semiconductor layer 18 on the SiO2 film, and the P electrode 13 is joined to an ohmic electrode 15a on the GaAs substrate 14. An N electrode 17 is formed on the top surface of the GaA semiconductor layer 18. |
申请公布号 |
JP2000106473(A) |
申请公布日期 |
2000.04.11 |
申请号 |
JP19990210862 |
申请日期 |
1999.07.26 |
申请人 |
SANYO ELECTRIC CO LTD |
发明人 |
HAYASHI NOBUHIKO;KANO TAKASHI |
分类号 |
H01L21/205;H01L33/06;H01L33/14;H01L33/16;H01L33/22;H01L33/32;H01L33/34;H01L33/40;H01L33/44;H01S5/00;H01S5/323;H01S5/343 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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