| 摘要 |
PROBLEM TO BE SOLVED: To realize an arrangement structure capable of adding a reproducible force to quartz or a sample to be detected with high reliability so as to keep the contact between the quartz and the sample by making an analyzing emission beam incident on a prescribed crystal to be used at a proper angle or at an angle proper for measurement. SOLUTION: An optical element has an inlet-side and input-side optical element, and the toroidal concave mirror 25 of the inlet-side and input-side optical element has a mirror mounted rotatable and pivotable relatively to the rear wall of an accessory device housing, a fixed flat mirror 26, and a toroidal/fixed elliptic surface mirror 28. The optical element has an outlet-side and output-side optical element, and the outlet-side and output-side optical element has a fixed toroidal/fixed elliptic surface mirror 30, a fixed flat mirror 31, and a flat mirror 32, and the flat mirror 32 is mounted rotatable and pivotable relatively to the rear wall of the housing. The fixed toroidal/elliptic mirrors 28, 30 are situated on the rear wall of the accessory device housing by dowels and fixed by screws 33, respectively. |
