发明名称 |
METHOD FOR FORMING A CAPACITOR OF SEMICONDUCTOR MEMORY |
摘要 |
PURPOSE: A fabrication method of capacitors using a ferroelectric substance having residual polarization property is provided to improve a hysteresis loop by restraining Bi volatile of SBT film and preventing chemical reaction between an insulator and the SBT film CONSTITUTION: The method comprises the steps of sequentially forming a lower electrode(14) and an SBT ferroelectric film(15) on a silicon substrate(11); patterning the SBT ferroelectric film(15) and the lower electrode(14); depositing SrTiO3 layer(16) on the SBT ferroelectric film(15) to be entirely surrounded by CVD(chemical vapor deposition) at 300-550°C, thereby stabilizing the SBT ferroelectric film(15) and preventing Bi volatile; etching the SrTiO3 layer(16) to expose the SBT ferroelectric film(15); and forming an upper electrode(17) on the exposed SBT ferroelectric film(15).
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申请公布号 |
KR20000007293(A) |
申请公布日期 |
2000.02.07 |
申请号 |
KR19980026553 |
申请日期 |
1998.07.02 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
YU, YONG SIK |
分类号 |
H01L21/8247;H01L21/02;H01L21/768;H01L21/822;H01L21/8242;H01L21/8246;H01L27/04;H01L27/10;H01L27/105;H01L27/108;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/461 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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