发明名称 METHOD FOR FORMING A CAPACITOR OF SEMICONDUCTOR MEMORY
摘要 PURPOSE: A fabrication method of capacitors using a ferroelectric substance having residual polarization property is provided to improve a hysteresis loop by restraining Bi volatile of SBT film and preventing chemical reaction between an insulator and the SBT film CONSTITUTION: The method comprises the steps of sequentially forming a lower electrode(14) and an SBT ferroelectric film(15) on a silicon substrate(11); patterning the SBT ferroelectric film(15) and the lower electrode(14); depositing SrTiO3 layer(16) on the SBT ferroelectric film(15) to be entirely surrounded by CVD(chemical vapor deposition) at 300-550°C, thereby stabilizing the SBT ferroelectric film(15) and preventing Bi volatile; etching the SrTiO3 layer(16) to expose the SBT ferroelectric film(15); and forming an upper electrode(17) on the exposed SBT ferroelectric film(15).
申请公布号 KR20000007293(A) 申请公布日期 2000.02.07
申请号 KR19980026553 申请日期 1998.07.02
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 YU, YONG SIK
分类号 H01L21/8247;H01L21/02;H01L21/768;H01L21/822;H01L21/8242;H01L21/8246;H01L27/04;H01L27/10;H01L27/105;H01L27/108;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/461 主分类号 H01L21/8247
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