| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide devices and the method that nearly uniformly correct the electron emission characteristics of the electron source having plural electron emission elements. SOLUTION: Each of the (i-1) pieces of elements are test driven which are from the j-th row to the (j+1-1)th row of the k-th column, among the m×n pieces of the electron emission element (hereinafter called the element), during the blanking period of input video signals, and measuring the emission current Ie of these elements. Then, on the basis of the drive quantity and the measurement result of the element at the time of the test drive, the correction data are determined which correct the variance of the present electron emission characteristics of the subject element. The series of process is performed by (i-1) pieces for each blanking period with respect to the m×n pieces of the element. The determined correction data are stored in a memory and used for the correction of the drive signal for driving columns in displaying the input video signal thereafter.</p> |
