发明名称 METHOF FOR FORMING A GATE OF SEMICONDUCTOR DEVICES
摘要 PURPOSE: A forming method of a gate is provided to improve a reliability of devices due to a short channel effect by maximize a channel length formed at bottom of the gate. CONSTITUTION: The method comprises the steps of: forming a convex and concave in a semiconductor substrate(11) by selective etching the semiconductor substrate(11) and cleaning; sequentially depositing a gate oxide(12) and a gate metal(13) on the entire surface of the semiconductor substrate having the concave and convex; and forming a gate(14) at boundary region of the concave and convex by selective etching the gate metal(13) and the gate oxide(12).
申请公布号 KR20000001769(A) 申请公布日期 2000.01.15
申请号 KR19980022176 申请日期 1998.06.13
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 YU, HYEOK JUN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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