发明名称 |
METHOF FOR FORMING A GATE OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A forming method of a gate is provided to improve a reliability of devices due to a short channel effect by maximize a channel length formed at bottom of the gate. CONSTITUTION: The method comprises the steps of: forming a convex and concave in a semiconductor substrate(11) by selective etching the semiconductor substrate(11) and cleaning; sequentially depositing a gate oxide(12) and a gate metal(13) on the entire surface of the semiconductor substrate having the concave and convex; and forming a gate(14) at boundary region of the concave and convex by selective etching the gate metal(13) and the gate oxide(12).
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申请公布号 |
KR20000001769(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980022176 |
申请日期 |
1998.06.13 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
YU, HYEOK JUN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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