发明名称 METHOD FOR FORMING A CONTACT HOLE OF SEMICONDUCTOR DEVICES
摘要 PURPOSE: A forming method of contact holes is provided to prevent a degradation of junction property by removing an anti-reflection layer without damage of an active silicon layer. CONSTITUTION: The contact hole forming method comprises the steps of forming an anti-reflection coating(ARC) layer(190) on an interlayer dielectric(180) formed on a semiconductor substrate(105) or a conductive layer(114); forming contact holes(150,160); coating a photoresist on the resultant structure filled into the contact holes; removing the photoresist and the ARC layer(190) to expose the portion of the interlayer dielectric(180); and removing the photoresist pattern buried into the contact holes(150,160).
申请公布号 KR20000000859(A) 申请公布日期 2000.01.15
申请号 KR19980020759 申请日期 1998.06.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEONG, HUN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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