发明名称 |
METHOD FOR FORMING A CONTACT HOLE OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A forming method of contact holes is provided to prevent a degradation of junction property by removing an anti-reflection layer without damage of an active silicon layer. CONSTITUTION: The contact hole forming method comprises the steps of forming an anti-reflection coating(ARC) layer(190) on an interlayer dielectric(180) formed on a semiconductor substrate(105) or a conductive layer(114); forming contact holes(150,160); coating a photoresist on the resultant structure filled into the contact holes; removing the photoresist and the ARC layer(190) to expose the portion of the interlayer dielectric(180); and removing the photoresist pattern buried into the contact holes(150,160).
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申请公布号 |
KR20000000859(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980020759 |
申请日期 |
1998.06.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JEONG, HUN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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