发明名称 Method and apparatus for generating exposure data of semiconductor integrated circuit
摘要 Producing an exposure data used for exposing a design pattern data of a semiconductor integrated circuit on an exposure medium. Repetitive exposure pattern data is extracted from the design pattern data as a group of exposure pattern data. The group of exposure pattern data includes plural pieces of the repetitive exposure pattern data. A rearrangement information table, which includes information for placing the plural pieces of repetitive exposure pattern data in a predetermined rearrangement area, is generated. The design pattern data is rearranged based on the rearrangement information table to generate the exposure data.
申请公布号 US5995878(A) 申请公布日期 1999.11.30
申请号 US19970963587 申请日期 1997.11.04
申请人 FUJITSU LIMITED 发明人 MIYAJIMA, MASAAKI
分类号 G03F7/22;G06F17/50;G06G7/66;H01L21/027;(IPC1-7):G06F19/00 主分类号 G03F7/22
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