发明名称 Process for depositing a stratified dielectric structure for enhancing the planarity of semiconductor electronic devices
摘要 A method of depositing a layered dielectric structure to improve the planarity of electronic devices which include a plurality of active elements having gate regions laid across the substrate as discrete parallel lines, such as the bit lines of memory cells. The bit lines are isolated from one another by a layered dielectric structure to provide a planar architecture onto which an optional conductive layer may be deposited. The dielectric structure is formed from a highly planarizing dielectric layer of the SOG type spun over a first insulating dielectric layer and solidified by means of a thermal polymerization process. After solidifying the dielectric layer, it is subjected to a rapid thermal annealing treatment.
申请公布号 US5994231(A) 申请公布日期 1999.11.30
申请号 US19970996920 申请日期 1997.12.23
申请人 SGS-THOMSON MICROELECTRONICS S.R.L. 发明人 SONEGO, PATRIZIA;COLABELLA, ELIO;BACCHETTA, MAURIZIO;PIVIDORI, LUCA
分类号 H01L21/3205;H01L21/3105;H01L21/316;H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/3205
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