发明名称 Memory tester with output of data pertaining to test sample
摘要 The tester transmits a test sample read-out request to a memory (30) and picks-up test sample signals from a data input and output bus (29a) as a reaction to the request the test sample signals are compared with their expectation values in a comparator (34). The output (22,23) has a sample number output for test sample numbers with corresponding data. A memory control (24,26-28) transmits the test sample request as a reaction to pertinent data. The output may be of programmed type. An Independent claim is included for the memory testing process.
申请公布号 DE19900299(A1) 申请公布日期 1999.10.21
申请号 DE19991000299 申请日期 1999.01.07
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO 发明人 NAKAMOTO, YUKIO
分类号 G01R31/319;G11C29/12;G11C29/38;G11C29/48;(IPC1-7):G11C29/00 主分类号 G01R31/319
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