发明名称 |
Memory tester with output of data pertaining to test sample |
摘要 |
The tester transmits a test sample read-out request to a memory (30) and picks-up test sample signals from a data input and output bus (29a) as a reaction to the request the test sample signals are compared with their expectation values in a comparator (34). The output (22,23) has a sample number output for test sample numbers with corresponding data. A memory control (24,26-28) transmits the test sample request as a reaction to pertinent data. The output may be of programmed type. An Independent claim is included for the memory testing process.
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申请公布号 |
DE19900299(A1) |
申请公布日期 |
1999.10.21 |
申请号 |
DE19991000299 |
申请日期 |
1999.01.07 |
申请人 |
MITSUBISHI DENKI K.K., TOKIO/TOKYO |
发明人 |
NAKAMOTO, YUKIO |
分类号 |
G01R31/319;G11C29/12;G11C29/38;G11C29/48;(IPC1-7):G11C29/00 |
主分类号 |
G01R31/319 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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