发明名称 Semiconductor thermal conditioning apparatus and method
摘要 An apparatus for thermally conditioning a semiconductor unit is provided which includes a surface plate for receiving the semiconductor unit thereon which is connected to a thermoelectric device and a closed loop heat exchanger. At least one temperature sensor is disposed adjacent the surface plate for sensing the temperature of the surface plate. The thermoelectric device has first and second sides with the first side disposed against the surface plate. The closed loop heat exchanger is coupled to the second side of the thermoelectric device. The closed loop heat exchanger includes a chamber or cavity having an inlet and an outlet with the chamber disposed adjacent the second side of the thermoelectric device. The closed loop heat exchanger further includes conduit connected to the inlet and outlet of the chamber and a heat transfer unit connected to the conduit opposite the chamber. Heat transfer fluid is contained within the closed loop heat exchanger and a pump is provided for pumping the heat transfer fluid through the closed loop heat exchanger wherein the heat transfer unit transfers heat to or from the heat transfer fluid to control the temperature of the heat transfer fluid. The thermoelectric device transfers heat to or from the surface plate to thermally condition the semiconductor unit disposed on the surface plate while the closed loop heat exchanger transfers heat to or from the second side of the thermoelectric device which increases the range of temperature under which the semiconductor unit may be thermally conditioned.
申请公布号 US5966940(A) 申请公布日期 1999.10.19
申请号 US19970972312 申请日期 1997.11.18
申请人 MICRO COMPONENT TECHNOLOGY, INC. 发明人 GOWER, ROGER;KINGERY, JOHN;GUTHRIE, J. CAMERON;FROST, KEVIN;MILLER, STEVE;UEKERT, KEN
分类号 F25B21/04;G01R31/01;G01R31/28;H01L21/00;H01L23/34;(IPC1-7):F25B21/02;F25B29/00 主分类号 F25B21/04
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