发明名称 Methods of forming thin film transistors
摘要 A method of forming film transistor includes, a) forming a thin film transistor layer of semiconductive material; b) providing a gate operatively adjacent the thin film transistor layer; c) forming at least one electrically conductive sidewall spacer over at least one lateral edge of the gate, the spacer being electrically continuous therewith; and d) providing a source region, a drain region, a drain offset region, and a channel region in the thin film transistor layer; the drain offset region being positioned operatively adjacent the one electrically conductive sidewall spacer and being gated thereby. The spacer is formed by anisotropically etching a spacer forming layer.
申请公布号 US5953596(A) 申请公布日期 1999.09.14
申请号 US19960769652 申请日期 1996.12.19
申请人 MICRON TECHNOLOGY, INC. 发明人 BATRA, SHUBNEESH;MANNING, MONTE;BANERJEE, SANJAY;JUNG, LETIEN
分类号 H01L21/28;H01L21/336;H01L29/49;H01L29/786;(IPC1-7):H01L21/00;H01L21/84 主分类号 H01L21/28
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