Logic built in self-test diagnostic method

摘要

A system and method for diagnosing the faults of an electronic device by running a series of tests, identifying the tests where the electronic device failed, without having to check the results of each test, storing information generated during only the tests where the electronic device failed, and using the information to diagnose the faults in the electronic device. The test results are accumulated into a Multiple Input Shift Register (MISR) which need not be examined after each test to determine which tests the device failed. The problem of a failure during one test manifesting into the MISR during subsequent tests is handled by predicting the effect of the failure on the MISR during subsequent tests.