发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device for forming a fine pattern. SOLUTION: In a manufacturing method of the semiconductor device for coating a material to be worked 1 with chemical amplifying positive resist 2 which consists of resin, a protective group and an acid generation agent and for executing patterning, a chemical amplifying positive resist 2 is patterned, and a preliminary resist pattern 12 is formed. Then, second ultraviolet rays 13 are irradiated, the protective group in the chemical amplifying positive resist 2 is extracted, the pattern of the preliminary resist pattern 12 is contracted, and the resist pattern is obtained.
申请公布号 JPH11168052(A) 申请公布日期 1999.06.22
申请号 JP19970334485 申请日期 1997.12.04
申请人 MITSUBISHI ELECTRIC CORP;RYODEN SEMICONDUCTOR SYST ENG CORP 发明人 HATTORI SACHIKO;KIMURA YOSHIKA;TSUJITA KOICHIRO;ODAMURA HIROKO
分类号 G03F7/039;G03F7/20;G03F7/40;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/039
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