发明名称 FUNCTION TESTING METHOD FOR ASYNCHRONOUS TRANSFER MODE DEVICE
摘要 PROBLEM TO BE SOLVED: To cope with various patterns and to easily and surely conduct a quality test by adding additional information corresponding to respective function parts to the payload of a cell, inputting it to an asynchronous transfer mode device, extracting additional information of the outputted cell in a device and judging the normality of the corresponding function part from additional information and the state of the cell. SOLUTION: In the verification of the operation of a header conversion part, a cell generator 2 adds predicted conversion header information to the payload of the cell from the header pattern table of a header conversion information part 241 on the cell generated by a cell generation part 21. A cell tester 3 separates and takes out header information and predicted conversion header pattern in a separation part 312 when the cell arrives and verifies the matching of the two header patterns in a comparison circuit 313 only at a part where the specified conversion mask pattern is not designated by a mask pattern table 311. Thus, comparison verification is automatically realized.
申请公布号 JPH11150544(A) 申请公布日期 1999.06.02
申请号 JP19970316989 申请日期 1997.11.18
申请人 FUJITSU LTD 发明人 MATOBA KEISUKE;YOSHIZUMI NOBUTAKA;WAKAYOSHI MITSUHARU;NOZAKI YOSHIKAZU
分类号 H04Q3/00;H04L12/26;H04L12/28;(IPC1-7):H04L12/28 主分类号 H04Q3/00
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