METHOD FOR TESTING SEMICONDUCTOR DEVICE WITH BUILT-IN NON-VOLATILE MEMORY

摘要

PROBLEM TO BE SOLVED: To provide a method for testing a semiconductor device with built-in non-volatile memory by which the production cost is reduced and the productivity is improved by shortening the test program renewal time. SOLUTION: The same memory as the memory data stored in a non-volatile memory is inputted to a tester (step 411) and this memory data is compiled to prepare the test response of the above non-volatile memory (421). This test response is taken into the test program to renew (step 431).