发明名称 |
RECONFIGURABLE ARCHITECTURE FOR LOGIC TEST SYSTEM |
摘要 |
A reconfigurable resource architecture enhances a test system's utilization by allowing product-mix dependent allocation of test system resources. The test system resources can be configured to test several device types with different pin counts simultaneously. The configuration can be changed to accommodate various product mixes based on pin count. |
申请公布号 |
KR0184639(B1) |
申请公布日期 |
1999.04.15 |
申请号 |
KR19900009198 |
申请日期 |
1990.06.21 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
MYDILL, MARC R.;PILE, SAM R.;O'KEEFE, SHEILA;OKERBLOM, NEALF;KEENAN W. RUSS |
分类号 |
G01R31/28;G01R31/319;G06F11/22;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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