Interferometer für die Prüfung optischer Elemente,申请号DE19944427317-传众专利搜索

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发明名称	Interferometer für die Prüfung optischer Elemente
摘要
申请公布号	DE4427317(C2)	申请公布日期	1999.04.01
申请号	DE19944427317	申请日期	1994.08.02
申请人	CARL ZEISS JENA GMBH, 07745 JENA, DE	发明人	ENDLICHER, WALTER, DIPL.-ING., 07751 GROSLOEBICHAU, DE;HOLOTA, WOLFGANG, DR.RER.NAT., 07745 JENA, DE;HOLOTA, KARIN, DIPL.-PHYS., 07745 JENA, DE;HEISE, JUERGEN, DIPL.-PHYS., 07745 JENA, DE
分类号	G01B9/02;(IPC1-7):G01M11/02;G02B27/00;G02B5/00	主分类号	G01B9/02
代理机构		代理人
主权项
地址

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