发明名称 CLEANER FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To extremely easily exfoliate a resist residue remained after dry etching and ashing with use of a reaction gas without corroding a wiring materials and the like, by using a cleaner for semiconductor device comprising a mix of each predetermined volume of water, fluorine compound, and water-soluble organic solvent. SOLUTION: The cleaner for semiconductor device is prepared by mixing by 0.1-10 wt.% fluorine compound, 50-80 wt.% water-soluble organic solvent, and total remnant of water. The actual example of the fluorine compound is expressed by a general formula R4 NF (R stands for hydrogen atom or 1-4C alkyl) and ammonium fluoride, hydrofluoric acid, ammonium acid fluoride, and the like are its typical example. The typical examples of the soluble organic solvent are formamide, monomethylformamide, dimethylfolmamide, and the like. A surface-active agent of cation, anion, nonion, and the like can be added to the cleaner for semiconductor device.
申请公布号 JPH1167632(A) 申请公布日期 1999.03.09
申请号 JP19970221564 申请日期 1997.08.18
申请人 MITSUBISHI GAS CHEM CO INC 发明人 MARUYAMA TAKEHITO;HASEMI TAKASHI;IKEDA HIDETOSHI;AOYAMA TETSUO
分类号 G03F7/42;H01L21/02;H01L21/027;H01L21/304;H01L21/3213;(IPC1-7):H01L21/027 主分类号 G03F7/42
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